The staff of GIE Media’s Manufacturing Group sends wishes for good health, happiness, and success in the coming year and always. Happy New Year!
London, United Kingdom – Element Materials Technology’s Minnetonka laboratory, formerly Medical Device Testing (MDT), expanded its A2LA ISO 17025 scope by adding an additional seven test methods to its capabilities.
The new expanded scope will add up to 12 test frames to Element’s global leading implant testing capacity, resulting in decreased time to market for clients and improved quality of life for the patient. The test methods address product evaluation testing of hip, knee, spine, and trauma implants. These certifications add to the laboratory’s list of cardiovascular test methods.
‘’We are delighted to add these services to our facility in Minnetonka and further expand our capacity to support our clients,” says Rick Sluiters, EVP Aerospace, Element. “The Minneapolis area is a growth hub for medical devices and Minnetonka’s proximity will supplement our leading medical capabilities in the area including medical packaging, environmental, and EMC testing.
Element Minnetonka is the largest cardiovascular, A2LA accredited, testing facility operating in the U.S., with over $6 million invested in commercial fatigue and durability test systems, inspection instruments, and test fixturing inventory. The laboratory specializes in pulsatile, axial, and bending fatigue on stents, catheters, and heart valves, as well as neurostimulation devices.
The ZEISS Customer Center located near the heart of Silicon Valley in Pleasanton, California, will offer demonstrations, applications development and training on the company's portfolio of optical, ion, electron, and X-ray microscopy.
Through its new Process Control Solutions (PCS) business unit, the company will leverage its core technology solutions and partnerships to address a range of special needs for semiconductor customers. The new business unit will be part of the ZEISS Semiconductor Manufacturing Technology (SMT) business group and draw on long standing innovations in microscopy that ZEISS is known for.
"We see a strong trend in semiconductors toward complex 3D chip structures and new materials," explained Dr. Karl Lamprecht, head of SMT business group. "As development cycles lengthen and R&D costs climb, the role of metrology changes. Our customers need effective process control solutions delivering integrated, actionable information that speeds time to problem resolution and time to production. ZEISS has the technology and expertise to fulfill these requirements."
With shrinking structure sizes, ever more sophisticated designs and hundreds of individual working steps, the semiconductor manufacturing workflow has become increasingly challenging. Fast and cost-effective process control solutions play a key role in ensuring the functioning of semiconductor devices. ZEISS is already a leading solutions provider in the semiconductor industry with its portfolio of lithography optics and mask metrology and repair solutions, and is now bringing its decades of semiconductor equipment experience into the market for semiconductor process control solutions.
The PCS business unit will use and expand upon ZEISS' existing portfolio of products, including its core proprietary microscopy technologies, to penetrate the semiconductor lab and fab space. Key products to be deployed include ZEISS's electron microscope products ZEISS Crossbeam and ZEISS MultiSEM (the latter of which incorporates the company's multi-electron-beam technology), ion-beam microscope ZEISS ORION NanoFab, as well as the ZEISS Xradia Versa and ZEISS Xradia Ultra non-destructive 3D X-ray microscope systems. Process control solutions will be offered across the spectrum of semiconductor manufacturing process steps, including front end of line (FEOL), back end of line (BEOL), packaging, and assembly.
"Our process control solutions offer comprehensive structural, chemical, and electrical information. By creating a single window into ZEISS for our semiconductor customers, we will enable them to address their process control challenges with seamlessly integrated technologies, helping them get their products to market faster," said Dr. Raj Jammy, Head of ZEISS PCS business unit, headquartered in Pleasanton, California. Dr. Jammy and his team will collaborate closely with global customers to address semiconductor inspection and review, failure analysis, defect detection, 3D tomography, and process characterization and analysis.
Urbana-Champaign, Illinois – Nanocrystals have diverse applications spanning biomedical imaging, light-emitting devices, and consumer electronics. Their unique optical properties result from the type of crystal from which they are composed. However, a major bottleneck in the development of nanocrystals, to date, is the need for X-ray techniques to determine the crystal type.
Researchers at the University of Illinois at Urbana-Champaign have developed a novel way to determine crystal type based on optics – by identifying the unique ways in which these crystals absorb light.
“This new ability eliminates the need for slow and expensive X-ray equipment, as well as the need for large quantities of materials that must be extensively purified,” explained Andrew M. Smith, an assistant professor of bioengineering and principle investigator for the project. “These theoretical and experimental insights provide simple and accurate analysis for liquid-dispersed nanomaterials that we think can improve the precision of nanocrystal engineering and also improve our understanding of nanocrystal reactions.”
“The results are even more clear than with standard materials characterization methods,” stated Sung Jun Lim, a postdoctoral fellow in Smith’s research group and first author of the paper, “Optical Determination of Crystal Phase in Semiconductor Nanocrystals,” appearing in Nature Communications. “In this study, we identified optical signatures of cubic and hexagonal phases in II–VI nanocrystals using absorption spectroscopy and first-principles electronic-structure theory. We observed that high-energy spectral features allow rapid identification of phase, even in small nanocrystals around two nanometers in diameter, or just several hundred atoms.”
According to André Schleife, an assistant professor of materials science and engineering and co-author of the study, the tight integration of accurate experimentation and cutting-edge theoretical spectroscopy realized in this work is a showcase for modern nanoscale research.
The optical crystallographic analysis technique that resulted from this collaboration provides a new and powerful ability to continuously measure phase during synthesis or processing in solution by absorption spectroscopy, which can be more simple, rapid, high-throughput, and potentially more accurate for structural characterization compared with solid phase X-ray techniques.
Department of Bioengineering, University of Illinois at Urbana-Champaign
In this baseball scenario, the scan of the model is prepared as a high-density electronic file with over a million points of information per second captured on the geometry of the proposed statue. This file is then posted in the cloud and downloaded by a local foundry. The foundry takes the point data and prepares a mold for the statues, which often measure up to 8’ in height. The brass is poured to produce a statue, then meticulously sculpted by Tom Tsuchiya into his final creation. As the photos here attest, the statues and plaques made for Reds Hall of Famers Tony Perez, Johnny Bench, and others evoked some strong emotions and memories.
Co-Presidents at Exact, Steve Young and Dean Solberg, are big sports fans, so this project was truly a labor of love. As Young, supervisor of the Cincinnati facility, explains, “We didn’t see a dry eye at the celebration for Tony Perez, a true gentleman and one of the brightest stars in a very crowded sky, that day.” Joining Perez for this momentous occasion were fellow teammates Johnny Bench, Pete Rose, Joe Morgan and other members from the famous “Big Red Machine” of the 1970’s.